|Title||Pencil beam coded aperture x-ray scatter imaging|
|Publication Type||Journal Article|
|Year of Publication||2012|
|Authors||K MacCabe, K Krishnamurthy, A Chawla, D Marks, E Samei, and D Brady|
|Pagination||16310 - 16320|
We use coded aperture x-ray scatter imaging to interrogate scattering targets with a pencil beam. Observations from a single x-ray exposure of a flat-panel scintillation detector are used to simultaneously determine the along-beam positions and momentum transfer profiles of two crystalline powders (NaCl and Al). The system operates with a 3 cm range resolution and a momentum transfer resolution of 0.1 nm 1. These results demonstrate that a single snapshot can be used to estimate scattering properties along an x-ray beam, and serve as a foundation for volumetric imaging of scattering objects. © 2012 Optical Society of America.
|Short Title||Optics Express|